A STM technique to study bulk properties
DOI: 10.1063/PT.5.023119
Primarily based on its atomic resolution imaging capability, the STM has had phenomenal success in the field of surface science. How can a truly surface-sensitive technique be used to measure a bulk property? The key trick applied by Weismann et al. is to exploit the wave nature of the electrons in copper and study their interference patterns on the surface caused by scattering centers in the bulk of the material. Their technique opens the door to a real-space investigation of electron propagation in materials and to the scattering of electrons at defects well below the surface.
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