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Ion implantation metallurgy

NOV 01, 1984
Beams of ions penetrate the surfaces of metals, forming new metastable alloys with made‐to‐order properties such as increased resistance to chemical and mechanical attack.
S. Thomas Picraux

Metallurgists are now able to take any element in the periodic table and implant it in the surface region of virtually any metal. Although the resulting novel metastable alloys are usually only a fraction of a micron thick, they have potentially important commercial applications and are contributing greatly to fundamental research on metals.

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References

  1. 1. G. Dearnaley, J. Metals 34, 18 (1982); https://doi.org/JOMTAA
    G. Dearnaley in Surface Engineering, R. Kossowsky, S. C. Singhal, eds., Plenum, New York (1984).

  2. 2. See, for example, Proc. Int. Conf. Ion Beam Modification of Materials, in Nucl. Instrum. and Methods 209–210 (1983);
    Treatise on Materials Science and Technology, vol. 18, J. K. Hirvonen, ed., Academic, New York (1980);
    S. T. Picraux, Ann. Rev. Mater. Sci. 14, 335 (1984);
    Ion Implantation and Ion Beam Processing of Materials, G. K. Hubler, O. W. Holland, C. R. Clayton, C. W. White, eds., North Holland, New York (1984).

  3. 3. S. M. Myers, J. E. Smugeresky, Met. Trans. 8A, 609 (1977);
    S. M. Myers, S. T. Picraux, T. S. Prevender, Phys. Rev. B9, 3953, 1974.

  4. 4. S. M. Myers, S. T. Picraux, R. E. Stoltz, J. Appl. Phys. 50, 5710 (1979).https://doi.org/JAPIAU

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  6. 6. S. M. Myers, D. M. Follstaedt, F. Besenbacher, J. Bottiger, J. Appl. Phys. 53, 8734 (1982).https://doi.org/JAPIAU

  7. 7. G. K. Hubler, E. McCafferty, Corrosion Science 20, 103 (1980).https://doi.org/CCRSDA

  8. 8. V. Ashworth, R. P. M. Proctor, W. A. Grant, Thin Solid Films 73, 179 (1980), and references therein.https://doi.org/THSFAP

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  10. 10. C. A. Carosella, I. L. Singer, R. C. Bowers, C. R. Gossett in Ion Implantation Metallurgy, C. M. Preece, J. K. Hirvonen, eds., The Metallurgical Society of AIME, Warrendale, Penn. (1980), p. 103.

  11. 11. R. Hutchings, W. C. Oliver, Wear 92, 143 (1983).https://doi.org/WEARCJ

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    M. Holz, P. Ziemann, N. W. Buckel, Phys. Rev. Lett. 51, 1584 (1983).https://doi.org/PRLTAO

  13. 13. J. M. Williams, G. M. Beardsley, R. A. Buchanan, R. K. Bacon in Ion Implantation and Ion Beam Processing of Materials, G. K. Hubler, O. W. Holland, C. R. Clayton, C. W. White, eds., North Holland, New York (1984), p. 735.

More about the authors

S. Thomas Picraux, Sandia National Laboratories, Albuquerque, New Mexico.

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This Content Appeared In
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Volume 37, Number 11

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