Inelastic X‐Ray Scattering in Condensed Matter Systems

Eric D. Isaacs; Phil Platzman

doi:10.1063/1.881488

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Inelastic X‐Ray Scattering in Condensed Matter Systems

FEB 01, 1996

Advances in synchrotron sources of hard x rays promise to open a new frontier in the use of inelastic scattering to probe eV and sub‐eV electronic excitations in simple and complex solids and liquids.

DOI: 10.1063/1.881488

Eric D. Isaacs

Phil Platzman

Scattering experiments have given us much of what we know about the microscopic behavior of an enormous variety of condensed matter systems. Simple but fascinating materials such as solid and liquid helium, transition metals such as iron and nickel, semiconductors such as silicon and gallium arsenide, complex oxides such as $V_{2} O_{3}$ and high‐temperature superconductors, and even more complex solids such as protein crystals have all been investigated by a variety of scattering probes.

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More about the authors

Eric D. Isaacs, AT&T Bell Laboratories, Murray Hill, New Jersey.

Phil Platzman, AT&T Bell Laboratories, Murray Hill, New Jersey.