Diffraction School
DOI: 10.1063/1.3067529
North American Philips Company, Inc. will hold its twelfth semiannual X‐Ray Diffraction School in Mount Vernon, N.Y. during the week beginning April 21 through April 25. Basic subjects to be covered will include x‐ray diffraction, new high and low temperature camera techniques, fluorescence analysis, Geiger counter, x‐ray spectrometer, and electron microscopy and electron diffraction. The Philips Company initiated the semiannual schools in the fall of 1946 in order to acquaint scientists and industrialists with the latest diffraction techniques for x‐ray analysis. Further information may be obtained by writing to the company at 750 South Fulton Avenue, Mount Vernon, N.Y.
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