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Article

Superconducting electronics

FEB 01, 1981
The extraordinary performance of Josephson‐junction circuits for scientific measurements, and the suitability of similar circuits for large scale integrated electronics, presage the emergence of a new technology.
Donald G. McDonald

The pioneers of superconducting electronics are accumulating an impressive record of achievement. For example, they have now gained the high‐performance lead in the important field of digital electronics. Logic delays of 13 picoseconds and switching times of 9 picoseconds have been experimentally demonstrated. The same basic devices, Josephson junctions, also make the most sensitive microwave detectors, the most sensitive magnetometers (or current sensors) and the most stable voltage sources. Although each of these developments is an important independent accomplishment, the combination of these developments in a single technology merits special attention.

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References

  1. 1. For a review with emphasis on high‐speed measurements, see D. G. McDonald, R. L. Peterson, C. A. Hamilton, R. E. Harris, R. L. Kautz, IEEE Trans. Electron Devices, ED‐27, 1945 (1980).

  2. 2. J. H. Greiner, C. J. Kircher, S. P. Klepner, S. K. Lahiri, A. J. Warnecke, S. Basavaiah, E. T. Yen, John M. Baker, P. R. Brosious, H.‐C. W. Huang, M. Murakami, I. Ames, IBM J. Res. Develop. 24, 195 (1980).

  3. 3. B. D. Josephson, Science 184, 527 (1974).https://doi.org/SCIEAS

  4. 4. C. D. Tesche, J. Clarke, J. Low Temp. Physics 29, 301 (1977).

  5. 5. R. F. Voss, R. B. Laibowitz, M. B. Ketchen, A. N. Broers, Conference Digest, Second International Conference on Superconducting Quantum Devices, Berlin, May 1980, page 94;
    M. W. Cromar, P. Carelli (to be published in Appl. Phys. Lett.).

  6. 6. T. R. Gheewala, IEEE Trans. Electron Devices, ED‐27, 1857 (1980).

  7. 7. R. W. Keyes, Proc. IEEE 63, 740 (1975).

  8. 8. M. O. Scully, in Coherence and Quantum Optics (L. Mandel, E. Wolf, eds.) Plenum, New York (1973); page 69.

  9. 9. R. F. Broom, P. Gueret, W. Kotyczka, Th. O. Mohr, A. Moser, A. Oosenbrug, P. Wolf, IEEE J. Solid‐State Circuits, SC‐14, 690 (1979).

  10. 10. R. F. Broom, S. I. Raider, A. Oosenbrug, R. E. Drake, W. Walter, IEEE Trans. Electron Devices, ED‐27, 1998 (1980).

  11. 11. H. H. Zappe, Proceedings of NSF Workshop on Opportunities for Microstructure Science, Engineering and Technology, Arlie, Va. (1978); page 209.

  12. 12. R. L. Kautz, J. Research NBS 84, 247 (1979).

  13. 13. J. Matisoo, Scientific American, May 1980, page 50.

  14. 14. R. L. Kautz, Appl. Phys. Lett. 36, 386 (1980).https://doi.org/APPLAB

  15. 15. J. Clarke, M. Tinkham, Phys. Rev. Lett. 44, 106 (1980).https://doi.org/PRLTAO

  16. 16. T. M. Shen, P. L. Richards, R. E. Harris, F. L. Lloyd, Appl. Phys. Lett. 36, 777 (1980); https://doi.org/APPLAB
    see also PHYSICS TODAY, August 1980, page 19.

More about the authors

Donald G. McDonald, National Bureau of Standards, Boulder, Colorado.

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This Content Appeared In
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Volume 34, Number 2

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