Discover
/
Article

Nanofabrication

FEB 01, 1990
Building complex semiconductor structures with features as small as 100 atoms across brings quantum effects to life but challenges fabrication technology.
Henry I. Smith
Harold G. Craighead

A decade ago the fabrication and study of electron devices whose smallest features were just under 1 micron in size represented the forefront of the field. Today that forefront has moved down an order of magnitude to 100 nanometers, engendering new terminology based on the prefix nano, from the Greek word for dwarf: “nanoscale devices,” “nanolithography,” “nanofabrication.”

This article is only available in PDF format

References

  1. 1. A. N. Broers, IBM J. Res. Dev. 32, 502 (1988). https://doi.org/IBMJAE
    M. Isaacson, A. Murray, J. Vac. Sci. Technol. 19, 1117 (1981).https://doi.org/JVSTAL

  2. 2. G. A. Sai‐Halasz, M. R. Wordeman, D. P. Kern, S. Rishton, E. Ganin, IEEE Electron Dev. Lett. 9, 464, 633 (1988). https://doi.org/EDLEDZ
    G. Shahidi, D. A. Antoniadis, H. I. Smith, IEEE Electron Dev. Lett. 9, 94 (1988).https://doi.org/EDLEDZ

  3. 3. U. K. Mishra, A. S. Brown, M. J. Delaney, P. T. Greiling, C. F. Krumm, IEEE Trans. Microwave Theory Tech. 37, 1279 (1989).https://doi.org/IETMAB

  4. 4. K. Ismail, D. A. Antoniadis, H. I. Smith, Appl. Phys. Lett. 55, 589 (1989).https://doi.org/APPLAB

  5. 5. T. A. Fulton, G. J. Dolan, Phys. Rev. Lett. 59, 109 (1987).https://doi.org/PRLTAO

  6. 6. K. Ralls, R. A. Buhrman, Phys. Rev. Lett. 60, 2434 (1988).https://doi.org/PRLTAO

  7. 7. W. Chu, A. Yen, K. Ismail, M. I. Shepard, H. J. Lezec, C. R. Musil, J. Melngailis, Y. C. Ku, J. M. Carter, H. I. Smith, J. Vac. Sci. Technol. B 7, 1583 (1989).https://doi.org/JVTBD9

  8. 8. R. L. Kubena, F. P. Stratton, J. W. Ward, G. M. Atkinson, R. J. Joyce, J. Vac. Sci. Technol. B 7, 1798 (1989).https://doi.org/JVTBD9

  9. 9. M. A. Gesley, F. J. Hohn, R. G. Viswanathan, A. D. Wilson, J. Vac. Sci. Technol. B 6, 2014 (1988).https://doi.org/JVTBD9

  10. 10. T. H. P. Chang, D. P. Kern, M. A. McCord, J. Vac. Sci. Technol. B 7, 1855 (1989).https://doi.org/JVTBD9

  11. 11. J. Itoh, T. Kanayama, N. Atoda, K. Hoh, J. Vac. Sci. Technol. B 6, 409 (1988). https://doi.org/JVTBD9
    A. Moel, M. L. Schattenburg, J. M. Carter, H. I. Smith, J. Vac. Sci. Technol. B 7, 1692 (1989).https://doi.org/JVTBD9

  12. 12. K. Ismail, W. Chu, A. Yen, D. A. Antoniadis, H. I. Smith, Appl. Phys. Lett. 54, 460 (1989).https://doi.org/APPLAB

  13. 13. C. T. Liu, K. Nakamura, D. C. Tsui, K. Ismail, D. A. Antoniadis, H. I. Smith, Appl. Phys. Lett. 55, 168 (1989).https://doi.org/APPLAB

  14. 14. K. Ismail, T. P. Smith, W. T. Masselink, H. I. Smith, Appl. Phys. Lett. 55, 2766 (1989).https://doi.org/APPLAB

  15. 15. J. P. Kotthaus, Phys. Scr. T19, 120 (1987).https://doi.org/PHSTBO

  16. 16. A. Yen, R. Ghanbari, H. I. Smith, Microelectron. Eng. (1989), to be published.

  17. 17. M. A. Reed, J. N. Randall, R. J. Aggarwall, R. J. Matyi, T. M. Moore, A. E. Wetsel, Phys. Rev. Lett. 60, 535 (1988).https://doi.org/PRLTAO

  18. 18. J. N. Randall, M. A. Reed, G. A. Frazier, J. Vac. Sci. Technol. B 7, 1398 (1989). https://doi.org/JVTBD9
    N. Margolus, T. Toffoli, G. Vichniac, Phys. Rev. Lett. 56, 1694 (1986).https://doi.org/PRLTAO

  19. 19. B. J. van Wees, H. van Houten, C. W. J. Beenakker, J. G. Williamson, L. P. Kouwenhoven, D. van der Marcel, C. T. Foxon, Phys. Rev. Lett. 60, 848 (1988). https://doi.org/PRLTAO
    D. A. Wharam, T. J. Thornton, R. Newbury, M. Pepper, H. Ahmed, J. E. F. Frost, D. G. Hasko, D. C. Peacock, D. A. Richie, G. A. C. Jones, J. Phys. C 21, L209 (1988).https://doi.org/JPSOAW

  20. 20. G. Timp, H. U. Baranger, P. de Vegvar, J. E. Cunningham, R. E. Howard, P. Behringer, P. M. Mankiewich, Phys. Rev. Lett. 60, 2081 (1988).https://doi.org/PRLTAO

  21. 21. K. Ismail, D. A. Antoniadis, H. I. Smith, Appl. Phys. Lett. 54, 1130 (1989).https://doi.org/APPLAB

  22. 22. H. Sakaki, Jpn. J. Appl. Phys. 19, L735 (1980).https://doi.org/JJAPA5

More about the authors

Henry I. Smith, Massachusetts Institute of Technology, Cambridge.

Harold G. Craighead, Cornell University, Ithaca, New York.

Related content
/
Article
A half century after the discovery of Hawking radiation, we are still dealing with the quantum puzzle it exposed.
/
Article
Since the discovery was first reported in 1999, researchers have uncovered many aspects of the chiral-induced spin selectivity effect, but its underlying mechanisms remain unclear.
/
Article
Metrologists are using fundamental physics to define units of measure. Now NIST has developed new quantum sensors to measure and realize the pascal.
/
Article
Nanoscale, topologically protected whirlpools of spins have the potential to move from applications in spintronics into quantum science.
This Content Appeared In
pt-cover_1990_02.jpeg

Volume 43, Number 2

Get PT newsletters in your inbox

pt_newsletter_card_blue.png
PT The Week in Physics

A collection of PT's content from the previous week delivered every Monday.

pt_newsletter_card_darkblue.png
PT New Issue Alert

Be notified about the new issue with links to highlights and the full TOC.

pt_newsletter_card_pink.png
PT Webinars & White Papers

The latest webinars, white papers and other informational resources.

By signing up you agree to allow AIP to send you email newsletters. You further agree to our privacy policy and terms of service.