Hot electrons in layered semiconductors
DOI: 10.1063/1.2913789
As electronic systems—and especially computers—are used more and more widely in almost all areas of endeavor and daily life, the semiconductor technology on which they are based is being pushed to ever larger‐scale integration and ever greater miniaturization. As the devices get smaller, and smaller, new problems (and maybe new opportunities) appear.1
References
1. See, for example, the papers of K. Hess, D. K. Ferry and J. R. Barker in Physics of Nonlinear Transport in Semiconductors, D. K. Ferry, J. R. Barker and C. Jacoboni, eds., Plenum, New York (1980).
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4. See K. Hess, in reference 1.
5. S. M. Sze, Physics of Semiconductor Devices, Wiley, New York (1969).
6. This effect was first proposed by John Bardeen and J. R. Schrieffer (Phys. Rev. 97, 641 (1955))
for MOS transistors and later investigated in detail by F. Stern, Phys. Rev. B 5, 4891 (1972).7. L. Esaki, R. Tsu, IBM Research Report No. RC‐2418, 1969.
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R. Dingle, H. L. Stormer, A. C. Gossard, W. Wiegmann, Appl. Phys. Lett. 3, 665 (1978).https://doi.org/APPLAB8. K. Hess, Appl. Phys. Lett. 35, 484 (1979); https://doi.org/APPLAB
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14. PHYSICS TODAY, April 1979, page 20.
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