Auger Electron Emission Can Identify Surface Impurities
NOV 01, 1967
DOI: 10.1063/1.3034026
Auger electron emission can be used to detect and identify contaminants on solid surfaces, with some advantages over the customary x‐ray method. Lawrence Harris, of the G. E. Research Center at Schenectady, developed the technique, and at the University of Minnesota Roland Weber and William Peria demonstrated that 1% of a monolayer of cesium can be detected on substrates of either germanium or silicon.
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© 1967 American Institute of Physics
