Atomic force microscope adapted as nanoscale thermometer
MAR 03, 2016
DOI: 10.1063/PT.5.029626
IEEE Spectrum : The atomic force microscope (AFM) helped open up the field of nanotechnology 30 years ago. Since then AFMs have been used to manipulate nanoscopic structures and measure their properties. Now Fabian Menges of IBM Zürich and his colleagues have adapted an AFM to measure both the amount of heat being transferred through the surface of a material and the material’s resistance to heat flow. Together, those values can be used to measure the amount of heat that is locally present in a nanoscale device. The researchers dubbed the technique “scanning probe thermometry.”
© 2016 American Institute of Physics
