Position errors in far-field optical imaging
The most basic function of an optical microscope is imaging the position of an object. But if the object is too small, the diffraction-limited optics blur the image. Superresolution imaging techniques, however, can turn that blurry information into a position with nanometer-scale accuracy (see Physics Today, December 2014, page 18
Now, in a collaboration between the University of Innsbruck, the Institute of Quantum Optics and Quantum Information, and the Technical University of Vienna, Arno Rauschenbeutel
To test their predictions for a polarization-dependent image shift, the researchers used two systems: a barium ion trapped by electric fields and a gold nanoparticle placed on an optical fiber. When imaging circularly polarized light, both systems displayed position shifts of about 150 nm, in agreement with the researchers’ expectations. When elliptically polarized light was used, that value increased to as much as 430 nm for the nanoparticle, more than four times its diameter.
Such large systematic shifts can be a problem when precisely determining an object’s position. If the object scatters or emits elliptically polarized light, measuring its position requires detailed knowledge about the light’s polarization. On the bright side, the effect can also yield information about the polarization of the light itself. (G. Araneda et al., Nat. Phys., 2018, doi:10.1038/s41567-018-0301-y