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The High‐Resolution Streamer Chamber

OCT 01, 1978
This relatively new development offers high multitrack efficiency, nearly isotropic response, short memory time and electronic “triggerability.”
Jack Sandweiss

As the contents of this issue of PHYSICS TODAY illustrate, the family of particle detectors that depend on electron multiplication processes in gases is a large and important one. Although the high‐pressure streamer chamber is a relatively new development, it is a direct outgrowth of one of the branches of this family tree. (The reader interested in the “genealogy,” as well as the physical and technical principles, will appreciate the excellent book by Peter Rice‐Evans.)

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References

  1. 1. P. Rice‐Evans, Spark, Streamer Proportional and Drift Chambers, Richlieu, London (1974).

  2. 2. G. E. Chikovani, V. A. Mikhailov, V. N. Roinishvili, Phys. Lett. 6, 254 (1963).https://doi.org/PHLTAM

  3. 3. B. A. Dolgoshein, B. U. Rodionox, B. I. Luchkov, Nucl. Instrum. Meth. 29, 270 (1964).https://doi.org/NUIMAL

  4. 4. F. Bulos, A. Odian, F. Villa, D. Yount, “Streamer Chamber Development,” SLAC Report No. 74 (1967).

  5. 5. T. Appelquist, R. M. Barnett, K. Lane, “Charm and Beyond,” to be published in Annual Review of Nuclear and Particle Physics, 28 (1978).

  6. 6. A. L. Read et al., “Search for short‐lived particles in high‐energy neutrino interactions identified using a hybrid emulsion–spark chamber arrangement,” Fermilab‐Pub‐78156‐Exp 7551.247 (submitted to Physical Review).

  7. 7. M. Dine, D. Ljung, T. Ludlam, R. Majka, J. Marx, P. Nemethy, J. Sandweiss, A. Schiz, J. Slaughter, H. Taft, M. Atac, S. Ecklund, “Search for short‐lived particles using a high‐resoulution streamer chamber,” Fermilab proposal No. 490.

  8. 8. R. Rohrbach, Proceedings of the International Conference on Instrumentation for High‐Energy Physics (1973); page 161.

  9. 9. Technique of Microwave Measurements, (C. G. Montcomery, ed), MIT Radiation Laboratory Series, Boston Technical Lithographics, Inc. (1963), page 725.

More about the authors

Jack Sandweiss, Yale University.

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This Content Appeared In
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Volume 31, Number 10

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