Material analysis with ion beams

NOV 01, 1976

Ion‐beam analysis, with its prime asset that the energetic projectile ions interact only with target nuclei, has provided quantitative information in many diverse investigations.

DOI: 10.1063/1.3024506

James F. Ziegler

All methods of material analysis by target stimulation, whether by photons, electrons or ions, yield a mixture of quantitative and qualitative information. Those techniques that give quantitative information are usually weak on qualitative chemical‐binding information, because they are insensitive to the complex perturbations of the outer‐shell binding electrons. Energetic ion beams, which interact only with target nuclei, are usually very quantitative and provide no binding information at all. This aspect of ion‐beam analysis is its prime asset.

References

1. New Uses of Ion Accelerators (J. F. Ziegler, ed.), Plenum, New York (1975).
This tutorial review emphasizes basic experimental and data‐analysis techniques; it covers material analysis by nuclear reactions, nuclear backscattering and ion‐induced x rays, with lengthy bibliographies of the approximately 400 papers available up to 1975.
2. Ion Beam Surface Layer Analysis (O. Meyer, G. Linker, G. Käppeler, eds.), 2 vols, Plenum, New York (1976).
This Proceedings of the Ion Beam Analysis Conference held in Karlsruhe, 1975, emphasizes new techniques.
3. Ion Beam Surface Layer Analysis (J. W. Mayer, J. F. Ziegler, eds.) Elsevier Sequoia (1974).
This Proceedings of the Ion Beam Analysis Conference held at Yorktown Heights, New York, 1973, emphasizes techniques and applications.
4. Chemical Analysis by Charged Particle Bombardment (G. Deconninck, G. Demortier, F. Bodart, eds.) Elsevier Sequoia (1972).
This Proceedings of a conference held at Namur in 1971 is broader in scope than the preceding books in that more chemists presented papers.
5. Proceedings of the International Conference on Modern Trends in Activation Analysis, in J. Radioanal. Chem. 16, no. 2 (1973). https://doi.org/JRACBN
This publication also refers to the three preceding conferences, held in 1965, 1967 and 1969.
6. W. A. Lanford, H. P. Trautvetter, J. F. Ziegler, J. Keller, Appl. Phys. Lett. 28, 566 (1975).https://doi.org/APPLAB
7. R. A. Langley, S. T. Picraux, F. L. Vook, J. Nucl. Mat. 53, 257 (1974).https://doi.org/JNUMAM
8. C. D. Mackenzie, B. H. Armitage, in reference 2, page 281.
9. S. Sundqvist, L. Gonczi, I. Koersner, R. Bergman, U. Lindh, in reference 2, page 945;
(also a private communication from J. A. Cookson, AERE Harwell, UK).
10. See reference 1, pages 75–158.
11. S. T. Picraux, in reference 1, pages 229–281.
12. F. Folkmann, in reference 2, pages 695 and 747.
13. T. A. Cahill, in reference 1, pages 1–71.
14. J. A. Cairns, A. Lurio, J. F. Ziegler, D. F. Holloway, J. Cookson; in reference 2, pages 773–783.

More about the Authors

James F. Ziegler. IBM Thomas J. Watson Research Center, Yorktown Heights, New York.