Interferometry with x rays

AUG 01, 1970

Interference patterns of diffracted x rays are so sensitive to small displacements that we can see strains and defects in crystals. Interest now is in absolute measurements of lattice spacings and fundamental constants.

DOI: 10.1063/1.3022280

Michael Hart

Ulrich Bonse

IN THIS NEW BRANCH of applied x‐ray optics, crystals that obey Bragg’s law of reflection are used as optical components. The physics of these devices is very simple and has long been available in the works of, for example, Max von Laue and Paul Ewald. Construction and operation of x‐ray interferometers, however, had to await the arrival of large, almost perfect, artificially grown single crystals. In the five years that have elapsed since the first successful x‐ray interferometer was made only a few of the possible applications have been exploited.

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More about the authors

Michael Hart, University of Bristol.

Ulrich Bonse, University of Münster.