High‐voltage electron microscopy

JUL 01, 1968

British, French, Japanese and US teams added accelerators to electron microscopes. Now voltages ten times conventional levels permit viewing of thicker, more representative specimens.

DOI: 10.1063/1.3035052

V. Ellis Cosslett

A SECOND GENERATION of electron microscopes, using ten times the voltage of conventional instruments, is beginning to fulfill designers’ hopes of allowing study of thicker specimens with less radiation damage. Voltages in the 1‐megavolt range have reduced the effect of chromatic aberration so that, a fixed value of resolution, usable specimen thickness can be increased roughly in the same ratio as voltage until it reaches a limit set by image visibility. Apart from a scaling up of the whole instrument, the only major difference in design is the insertion of an accelerator between the electron gun and the microscope itself. High‐voltage instruments are being used in metal studies by investigators who want a specimen thick enough to display bulk properties and, in biology, to probe living matter. A still larger machine is under construction in France.

This article is only available in PDF format

References

1. L. Reimer, Z. Naturforsch. 21a, 1489 (1966).
2. V. E. Cosslett, Optik 25, 383 (1967).
3. F. Lenz, Z. Naturforsch. 9a, 185 (1954).
4. G. H. Smith, R. E. Rurge, Proc. Phys. Soc. 81, 612 (1963).https://doi.org/PPSOAU
5. G. H. Curtis, V. E. Cosslett, R. P. Ferrier, in Proc. 4th European Conf. Elect. Mic., Rome (1968); in press.
6. R. E. Burge, G. H. Smith, Nature 195, 140 (1962).https://doi.org/NATUAS
7. H. Hashimoto, A. Howie, M. J. Whelan, Phil. Mag. 5, 967 (1960); https://doi.org/PHMAA4
H. Hashimoto, A. Howie, M. J. Whelan, Proc. Roy. Soc. A261, 80 (1962).
8. A. Howie, Phil. Mag. 14, 223 (1966).https://doi.org/PHMAA4
9. H. Hashimoto, J. Appl. Phys. 35, 277 (1964).https://doi.org/JAPIAU
10. G. Thomas, Phil. Mag. 17, 1097 (1968).https://doi.org/PHMAA4
11. R. Uyeda, M. Nonoyama, Japan J. Appl. Phys. 6, 557 (1967).https://doi.org/JJAPA5
12. M. J. Makin, in Proc. 4th European Conf. Elect. Mic., Rome (1968); in press.
13. K. C. A. Smith, K. T. Considine, V. E. Cosslett, in Proc. 6th Internat. Congr. Elect. Mic., Kyoto (Maruzen, Tokyo) 1, 99 (1966).
14. G. Dupouy, F. Perrier, J. Microscopie 1, 167 (1962).
15. H. Fujita, Japan J. Appl. Phys. 6, 214 (1967).https://doi.org/JJAPA5
16. G. Dupouy, F. Perrier, C. R. Acad. Sci. (Paris) 253, 2435 (1961); https://doi.org/COREAF
G. Dupouy, F. Perrier, 258, 4213 (1964).https://doi.org/COREAF , Acad. Sci., Paris, C. R.
17. U. Valdrè, M. J. Goringe, J. W. Steeds, Proc. 4th European Conf. Elect. Mic., Rome (1968); in press.
18. I. B. Puchalska, R. P. Ferrier, Thin Solid Films, 1, 437 (1967–68); https://doi.org/THSFAP
Physica Status Solidi (1968).
19. G. Dupouy, F. Perrier, C. R. Acad. Sci. (Paris) 261, 4649 (1965).https://doi.org/COREAF
20. K. Kobayashi, K. Sakaoku, in Quantitative Electron Microscopy, (G. F. Bahr, E. H. Zeitler, eds.) Williams and Wilkins, Baltimore (1965), p 359.
21. K. J. Hale, M. Henderson‐Brown, Proc. 4th European Conf. Elect. Mic., Rome (1968); in press.
22. G. Dupouy, F. Perrier, L. Durrieu, C. R. Acad. Sci. (Paris) 251, 2836 (1960).https://doi.org/COREAF
23. G. Dupouy, in Adv. Optical and Elect. Mic. 2, 167 (1968).

More about the Authors

V. Ellis Cosslett. Cavendish Laboratory, Cambridge.