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30 years of small‐angle x‐ray scattering

NOV 01, 1969

In the early days of x‐ray diffraction, scattering close to the primary beam was a nuisance, to be disposed of with a large beam trap. Careful study of this scattering has yielded information on features intermediate in scale between that of the atomic arrangement in a crystal and that of the images in the electron microscope.

DOI: 10.1063/1.3035251

André Guinier

EXPERIMENTAL AND THEORETICAL advances in the study of x‐ray diffraction at small angles both started about 30 years ago. With the focusing crystal monochromator experimenters could obtain the intensity and resolution they needed to resolve the diffraction pattern close to the primary beam. Now many other methods allow a study of this kind of scattering. And application of the form‐factor concept in scattering theory provided a statistical measure for the average size and shape of the small grains that are responsible for this kind of scattering.

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More about the authors

André Guinier, Solid‐State Physics, Faculté Des Sciences, Orsay.

© 1969 American Institute of Physics

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This Content Appeared In

Volume 22, Number 11

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