30 years of small‐angle x‐ray scattering
NOV 01, 1969
In the early days of x‐ray diffraction, scattering close to the primary beam was a nuisance, to be disposed of with a large beam trap. Careful study of this scattering has yielded information on features intermediate in scale between that of the atomic arrangement in a crystal and that of the images in the electron microscope.
DOI: 10.1063/1.3035251
EXPERIMENTAL AND THEORETICAL advances in the study of x‐ray diffraction at small angles both started about 30 years ago. With the focusing crystal monochromator experimenters could obtain the intensity and resolution they needed to resolve the diffraction pattern close to the primary beam. Now many other methods allow a study of this kind of scattering. And application of the form‐factor concept in scattering theory provided a statistical measure for the average size and shape of the small grains that are responsible for this kind of scattering.
More about the Authors
André Guinier.
Solid‐State Physics, Faculté Des Sciences, Orsay.
© 1969. American Institute of Physics
